Ionizing radiation study in submicron MOS structures by bipolar operation

Journal article

Peer reviewed

H. Bakhtiar, C. Picard, A. Soltani, A. Hoffmann, P. Mialhe and J.P. Charles

ECS Journal of Solid State Science and Technology, Vol.9, pp.9-21

2001

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Title: Ionizing radiation study in submicron MOS structures by bipolar operation
Creators - without role: H. Bakhtiar
C. Picard
A. Soltani - Institut d'électronique de microélectronique et de nanotechnologie
A. Hoffmann - Centre d'Electronique et de Micro-optoélectronique de Montpellier
P. Mialhe
J.P. Charles
Publication Details: ECS Journal of Solid State Science and Technology, Vol.9, pp.9-21
Identifiers: 9943851909311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-00152601