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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
Journal article   Peer reviewed

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser, Viyas Gupta, Georgios Tsiligiannis, Arto Javanainen, Heikki Kettunen, Helmut Puchner, Frédéric Saigné, Ari Virtanen, Frédéric Wrobel and Luigi Dilillo
IEEE Transactions on Nuclear Science, Vol.62(6), pp.2620-2626
17/12/2015
DOI: https://doi.org/10.1109/TNS.2015.2496874

Abstract

Cluster of bit flips radiation testing multiple cell upset (MCU) dynamic test SEFI RAM single event upset (SEU) static test
During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
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