Investigation of Single-Event Transients in Linear Voltage Regulators

Farokh Irom; Tetsuo F. Miyahira; Philippe C. Adel; Jamie S. Laird; Brandon Conder; Vincent Pouget; Fabien Essely

doi:10.1109/TNS.2008.2007800

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Investigation of Single-Event Transients in Linear Voltage Regulators

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Investigation of Single-Event Transients in Linear Voltage Regulators

Farokh Irom, Tetsuo F. Miyahira, Philippe C. Adel, Jamie S. Laird, Brandon Conder, Vincent Pouget et Fabien Essely

IEEE transactions on nuclear science, Vol.55(6), pp.3352-3359

01/12/2008

DOI: https://doi.org/10.1109/TNS.2008.2007800

Résumé

Engineering

Engineering, Electrical & Electronic

Nuclear Science & Technology

Science & Technology

Technology

Single-event transients (SETs) from heavy ions and laser beam are investigated for two positive adjustable linear voltage regulators: the RH117 from Linear Technology and the HS-117RH from Intersil. Both positive and negative going transients are observed. The role of input voltage, load capacitance and supply current on the SET response is discussed.

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Détails

Titre: Investigation of Single-Event Transients in Linear Voltage Regulators
Créateurs - sans rôle: Farokh Irom - CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
Tetsuo F. Miyahira - CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
Philippe C. Adel - CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
Jamie S. Laird - CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
Brandon Conder - CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
Vincent Pouget - Univ Bordeaux, F-33405 Talence, France
Fabien Essely - Univ Bordeaux, F-33405 Talence, France
Détails de publication: IEEE transactions on nuclear science, Vol.55(6), pp.3352-3359
Éditeur: IEEE
Nombre de pages: 8
Identifiants: 99162639509311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Journal article