Logo image
Sign in
Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering
Journal article   Open access   Peer reviewed

Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering

Laurent Latorre, Béatrice Pradarelli and Pascal Nouet
International Journal of Online Engineering, Vol.5(5), pp.43-50
28/08/2009

Abstract

Education Remote Labs Network Automated Test Equipment IC Testing
url
Find in HALView

Metrics

1 Record Views

Details

Logo image