Logo image
Sign in
Influence of the organic pollution on the reliability of HE9 connectors
Journal article   Peer reviewed

Influence of the organic pollution on the reliability of HE9 connectors

L. Cretinon, M. El Hadachi, F. Augereau, L. Doireau and Gilles Despaux
Microelectronics Reliability, Vol.48(8-9), pp.1129 - 1132
08/2008
url
Find in HALView

Metrics

1 Record Views

Details

Logo image