Abstract
In this paper, the influence of silane flow on metalorganic vapour phase epitaxy (MOVPE) grown GaN on sapphire substrate by an in situ SiN treatment has been investigated. A flow of 10 sccm with treatment duration of 120 s appears to be the optimal value and improves the crystal quality. The dislocation density, determined by atomic force microscopic (AFM), is as low as 5 x 10(8) cm(-2). A reduction of I-2 full width at half maximum (FWHM) to 4 meV and an increase of both BE/YL and BE/DAP intensity ratio are also obtained. (C) 2004 Elsevier B.V. All rights reserved.