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In Situ Investigation of Si-TPA-MFI Crystallization Using (Ultra-) Small- and Wide-Angle X-ray Scattering
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In Situ Investigation of Si-TPA-MFI Crystallization Using (Ultra-) Small- and Wide-Angle X-ray Scattering

Peter-Paul E. A. de Moor, Theo P. M. Beelen, Bernd U. Komanschek, Olivier Diat et Rutger A. van Santen
The journal of physical chemistry. B, Vol.101(51), pp.11077-11086
18/12/1997

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