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Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh
Journal article   Open access   Peer reviewed

Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh

Emna Farjallah, Jean-Marc Armani, Valentin Gherman and Luigi Dilillo
Microelectronics Reliability, Vol.96, pp.37-45
05/2019

Abstract

Adaptability Bit error rate Data retention data storage time NAND flash flash memory SSD Reliability instrumentation
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