Résumé
It has been demonstrated that the resonance frequency of the cantilever in atomic force modulation microscopy can be used to study local mechanical properties. We developed a numerical method to achieve mapping of the resonance frequency without significant modification of the device. By making the assumption that the resonance spectrum can be approximated by a Lorentzian curve, we established analytical expressions of the resonance frequency and the width of the curve (damping) depending on the real and imaginary parts of the vibration at a single frequency. Then, resonance frequency and damping images were produced from the recording of both the real and imaginary part images of the complex amplitude. The results on a standard high-impact polystyrene sample are shown.