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IGBT Wirebonds Ageing: A New Test Bench Development for Dedicated Modules Assemblies
Journal article   Open access   Peer reviewed

IGBT Wirebonds Ageing: A New Test Bench Development for Dedicated Modules Assemblies

Guillaume Pellecuer, Jean-Jacques Huselstein, Thierry Martiré, François Forest, André Chrysochoos and Mourad Jebli
European Journal of Electrical Engineering, Vol.24(4), pp.161 - 169
2022

Abstract

wirebonds ageing power cycling specific samples design test benches development
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https://doi.org/10.18280/ejee.240401View
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