- Title
- I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors
- Creators - without role
- Jérémy Raoult - Université de Montpellier, Institut d'Electronique et des Systèmes - IESFabien Pascal - Université de Montpellier, Institut d'Electronique et des Systèmes - IESCédric Leyris - STMicroelectronics
- Publication Details
- Thin Solid Films, Vol.518(9), pp.2497-2500
- Identifiers
- 9945457409311
- Academic Unit
- Institut d'Electronique et des Systèmes - IES
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-01894480
Journal article
I-V and Low frequency noise characterization of Polysilicon and Amorphous Ti- and Co- salicide resistors
Thin Solid Films, Vol.518(9), pp.2497-2500
26/02/2010
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