Hot-carrier thermal conductivity from the simulation of submicron semiconductor structures

Journal article

Peer reviewed

P. Golinelli, R. Brunetti, L. Varani, J.-C. Vaissière, J.-P. Nougier, L. Reggiani, E. Starikov, P. Shiktorov, V. Gruzinskis, T. Gonzalez, …

Semiconductor Science and Technology, Vol.12(11), pp.1511-1513

01/11/1997

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Title: Hot-carrier thermal conductivity from the simulation of submicron semiconductor structures
Creators - without role: P. Golinelli - Istituto Nazionale per la Fisica della Materia
R. Brunetti - Istituto Nazionale per la Fisica della Materia
L. Varani - Université de Montpellier
J.-C. Vaissière - Université de Montpellier
J.-P. Nougier - Université de Montpellier
L. Reggiani - Istituto Nazionale per la Fisica della Materia
E. Starikov - Computational Physics
P. Shiktorov - Computational Physics
V. Gruzinskis - Computational Physics
T. Gonzalez - Universidad de Salamanca
M.-J. Martin - Universidad de Salamanca
D. Pardo - Universidad de Salamanca
Publication Details: Semiconductor Science and Technology, Vol.12(11), pp.1511-1513
Identifiers: 9944645109311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-02394527