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Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures
Journal article   Peer reviewed

Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures

L. Varani, L Reggiani, P Houlet, J. C. Vaissiere, J. P. Nougier, T. Kuhn, T. Gonzalez and D. Pardo
Semiconductor Science and Technology, Vol.9(5S), pp.584-587
01/05/1994
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