- Title
- High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM
- Creators - without role
- James Whitby - Swiss Federal Laboratories for Materials Science and TechnologyFredrik Östlund - Swiss Federal Laboratories for Materials Science and TechnologyPeter Horvath - Swiss Federal Laboratories for Materials Science and TechnologyMihai Gabureac - Swiss Federal Laboratories for Materials Science and TechnologyJessica Riesterer - Swiss Federal Laboratories for Materials Science and TechnologyIvo Utke - Swiss Federal Laboratories for Materials Science and TechnologyMarkus Hohl - TofwerkLibor Sedláček - TescanJaroslav Jiruše - TescanVinzenz Friedli - Swiss Federal Laboratories for Materials Science and TechnologyMikhael Bechelany - Université de Montpellier, Institut Européen des Membranes - IEMJohann Michler - Swiss Federal Laboratories for Materials Science and Technology
- Publication Details
- Advances in Materials Science and Engineering, Vol.2012, pp.1 - 13
- Identifiers
- 9946002509311
- Academic Unit
- Institut Européen des Membranes - IEM
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-01692106
Journal article
High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with In Situ AFM
Advances in Materials Science and Engineering, Vol.2012, pp.1 - 13
2012
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