High-Frequency Noise in Modern FET/HEMT Channels Caused by the Excitation of 2D-Plasma Waves

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P. Shiktorov, E. Starikov, V. Gružinskis, L. Varani and L. Reggiani

Acta Physica Polonica A, Vol.119(2), pp.117-120

02/2011

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Title: High-Frequency Noise in Modern FET/HEMT Channels Caused by the Excitation of 2D-Plasma Waves
Creators - without role: P. Shiktorov - Semiconductor Physics Institute (Vilnius)
E. Starikov - Semiconductor Physics Institute (Vilnius)
V. Gružinskis - Semiconductor Physics Institute (Vilnius)
L. Varani - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
L. Reggiani - National Interuniversity Consortium for the Physical Sciences of Matter
Publication Details: Acta Physica Polonica A, Vol.119(2), pp.117-120
Identifiers: 9945850209311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-02443677