Fragmented high-energy heavy ion beams for electronics testing

Ruben Garcia Alia; Kacper Bilko; Francesco Cerutti; Andrea Coronetti; Natalia Emriskova; Luigi Esposito; Francesc Salvat Pujol; Andreas Waets; Sylvain Girard; Frederic Saigne; Marco Durante; Christoph Schuy; Tim Wagner

doi:10.1109/TNS.2022.3210403

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Fragmented high-energy heavy ion beams for electronics testing

Journal article

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Fragmented high-energy heavy ion beams for electronics testing

Ruben Garcia Alia, Kacper Bilko, Francesco Cerutti, Andrea Coronetti, Natalia Emriskova, Luigi Esposito, Francesc Salvat Pujol, Andreas Waets, Sylvain Girard, Frederic Saigne, …

IEEE Transactions on Nuclear Science, pp.1-1

05/10/2022

DOI: https://doi.org/10.1109/TNS.2022.3210403

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Title: Fragmented high-energy heavy ion beams for electronics testing
Creators - without role: Ruben Garcia Alia - European Organization for Nuclear Research
Kacper Bilko - CERN [Genève]
Francesco Cerutti - European Organization for Nuclear Research
Andrea Coronetti - European Organization for Nuclear Research
Natalia Emriskova - European Organization for Nuclear Research
Luigi Esposito - European Organization for Nuclear Research
Francesc Salvat Pujol - CERN [Genève]
Andreas Waets - European Organization for Nuclear Research
Sylvain Girard - Laboratoire Hubert Curien
Frederic Saigne - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Marco Durante - GSI Helmholtz Centre for Heavy Ion Research
Christoph Schuy - GSI Helmholtz Centre for Heavy Ion Research
Tim Wagner - GSI Helmholtz Centre for Heavy Ion Research
Publication Details: IEEE Transactions on Nuclear Science, pp.1-1
Identifiers: 9947767509311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-03978737