Résumé
Current Design-for-Test solutions for scan-based testing such as IEEE 1687 offer rich and powerful access to embedded resources. While this is extremely helpful for testing purposes, it also raises serious security concerns as malicious users could exploit it to gain control of the chip or leak sensitive information. Current solutions, such as Scan Encryption, are all hardware based and incompatible with the Automated Test Flow, seriously limiting their applicability, portability and reuse. In this paper, we show how the features of the upcoming IEEE P1687.1 can be leveraged and extended to not only include Scan Encryption as a native feature but also as a portable Embedded IP block. The experimental results show that thanks to the new Standard, a fully Secure Automated Test Flow can be integrated inside existing tools without custom software modifications.