Logo image
Sign in
Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope
Journal article   Peer reviewed

Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope

Renaud Podor, J. Mendonça, J. Lautru, H.P. Brau, D. Nogues, A. Candeias, P. Horodysky, A. Kolouch, M. Barreau, X. Carrier, …
Journal of Microscopy, Vol.282(1), pp.45-59
04/2021

Abstract

url
Find in HALView

Metrics

1 Record Views

Details

Logo image