- Title
- Estimation of Low Dose Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments
- Creators - without role
- J. Boch - Université de MontpellierFrédéric Saigné - Université de MontpellierR.D. Schrimpf - Vanderbilt UniversityJ.-R. Vaillé - Université de MontpellierL. Dusseau - Université de Montpellier
- Publication Details
- IEEE Transactions on Nuclear Science, Vol.VOL 52(NUMB 6), pp.pages 2616-2621
- Identifiers
- 9947342809311
- Academic Unit
- Université de Montpellier
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-00327775
Journal article
Estimation of Low Dose Rate Degradation on Bipolar Linear Integrated Circuits Using Switching Experiments
IEEE Transactions on Nuclear Science, Vol.VOL 52(NUMB 6), pp.pages 2616-2621
2005
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