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Enhanced THz Detection Through Phase-Controlled Current Response in Field-Effect Transistors
Journal article   Peer reviewed

Enhanced THz Detection Through Phase-Controlled Current Response in Field-Effect Transistors

Abdelhamid Mahi, Hugues Marinchio, Christophe Palermo, Abderrahmane Belghachi and Luca Varani
IEEE Electron Device Letters, Vol.34(6), pp.795 - 797
06/2013
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