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Elaboration and characterization of MOCVD (Bi1-x Sbx)2 Te3 thin films
Journal article   Peer reviewed

Elaboration and characterization of MOCVD (Bi1-x Sbx)2 Te3 thin films

A. Mzerd, B. Aboulfarah, Alain Giani and A. Boyer
Journal of Materials Science, Vol.41(5), pp.1659-1662
03/2006
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