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Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications
Journal article   Peer reviewed

Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications

Florence Azaïs, Serge Bernard, Mariane Comte, Yves Bertrand and Michel Renovell
Journal of Electronic Testing: : Theory and Applications, Vol.21(3), pp.291-298
2005
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