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Effect of molecular structure on bias stress effect in organic thin-film transistors
Journal article   Peer reviewed

Effect of molecular structure on bias stress effect in organic thin-film transistors

A. K. Diallo, Alain Fages, F. Serein-Spirau, Jean-Pierre Lère-Porte and C. Videlot-Ackermann
Applied Surface Science, Vol.257, pp.9386-9389
14/06/2011

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