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Effect of Switching from High to Low Dose Rate on Linear Bipolar Technology Radiation Response
Journal article   Peer reviewed

Effect of Switching from High to Low Dose Rate on Linear Bipolar Technology Radiation Response

J. Boch, Frédéric Saigné, R.D. Schrimpf, D.M. Fleetwood, S. Ducret, L. Dusseau, J.-P. David, J. Fesquet, J. Gasiot and R. Ecoffet
IEEE Transactions on Nuclear Science, Vol.51(Issue 5, Part 3), pp.2896-2902
10/2004
DOI: https://doi.org/10.1109/TNS.2004.835047

Abstract

The degradation of discrete and integrated-circuit bipolar technologies irradiated at High Dose Rate (HDR) and then switched to Low Dose Rates (LDR) is studied. It is shown that the degradation rate of switched devices is equal to that found at low dose rates for all the tested devices.
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