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Direct Observation of the Surface Topography at High Temperature with SEM
Journal article   Open access

Direct Observation of the Surface Topography at High Temperature with SEM

Renaud Podor, X. F Le Goff, Joseph Lautru, H.P. Brau, Mathias Barreau, Xavier Carrier, Jerôme Mendonça, Dorian Nogues and Antoine Candeias
Microscopy and Microanalysis, Vol.26(3), pp.397-402
06/2020

Abstract

3D surface reconstruction SEM high temperature topography
High-temperature scanning electron microscopy allows the direct study of the temperature behavior of materials. Using a newly developed heating stage, tilted images series were recorded at high temperature and 3D images of the sample surface were reconstructed. By combining 3D images recorded at different temperatures, the variations of material roughness can be accurately described and associated with local changes in the topography of the sample surface.
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