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Direct Monte Carlo simulation of hot-carrier conductivity
Article de revue   Avec comité de lecture

Direct Monte Carlo simulation of hot-carrier conductivity

Lino Reggiani, Luca Varani et Vladimir Mitin
Solid-state electronics, Vol.32(12), pp.1383-1386
01/12/1989

Résumé

Electronic transport impurity centers Monte Carlo method scattering mechanisms semiconductors
We present a Monte Carlo procedure which, by including the mechanism of generation and recombination from impurity centers, enables us to calculate directly from the simulation the field dependent conductivity for the first time. The reliability of the theoretical model has been checked by comparing numerical results with experiments provided by the Montpellier group and performed on p-Si at different acceptor concentrations and temperatures.

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1 Consultations de la notice

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