- Title
- Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions
- Creators - without role
- J.-M. Palau - Centre d'Electronique et de Micro-optoélectronique de MontpellierG. Hubert - Université de MontpellierK. Coulié - Université de MontpellierB. Sagnes - Université de MontpellierM.-C. CalvetS. Fourtine - Airbus
- Publication Details
- IEEE Transactions on Nuclear Science, Vol.48(2), pp.225-231
- Identifiers
- 9943708509311
- Academic Unit
- Université de Montpellier
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-02024841
Journal article
Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions
IEEE Transactions on Nuclear Science, Vol.48(2), pp.225-231
04/2001
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