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Determination of structural parameters characterizing thin films by optical methods: A comparison between scanning angle reflectometry and optical waveguide lightmode spectroscopy
Article de revue   Avec comité de lecture

Determination of structural parameters characterizing thin films by optical methods: A comparison between scanning angle reflectometry and optical waveguide lightmode spectroscopy

C. Picart, G. Ladam, B. Senger, J.-C. Voegel, P. Schaaf, F. Cuisinier et C. Gergely
The Journal of chemical physics, Vol.115(2), pp.1086-1094
2001

Résumé

Chemical Sciences Engineering Sciences Optics or physical chemistry Photonic Polymers Theoretical and

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