Detection of acetylene impurities in ethylene and polyethylene manufacturing processes using tunable diode laser spectroscopy in the 3-μm range

Journal article

Peer reviewed

P. Kluczynski, M. Jahjah, L. Nähle, O. Axner, S. Belahsene, M. Fischer, J. Koeth, Y. Rouillard, J. Westberg, A. Vicet, …

Applied Physics B - Laser and Optics, Vol.105(2), pp.427 - 434

11/2011

Files and links (1)

url

Find in HALView

1 Record Views

Title: Detection of acetylene impurities in ethylene and polyethylene manufacturing processes using tunable diode laser spectroscopy in the 3-μm range
Creators - without role: P. Kluczynski - Siemens
M. Jahjah - Université de Montpellier
L. Nähle - Nanoplus
O. Axner
S. Belahsene - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
M. Fischer - Nanoplus
J. Koeth - Nanoplus
Y. Rouillard - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
J. Westberg
A. Vicet - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
S. Lundqvist - Siemens
Publication Details: Applied Physics B - Laser and Optics, Vol.105(2), pp.427 - 434
Identifiers: 9946788209311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-01619163