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Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments
Journal article   Open access   Peer reviewed

Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments

Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard and Xiaoqing Wen
IEEE Transactions on Aerospace and Electronic Systems, Vol.59(3), pp.2885-2897
06/2023

Abstract

Circuit reliability latch design Quadruple Node Upset (QNU) Radiation-hardening Soft-error
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