Résumé
In this paper, the dependence of XLPE electrical breakdown on carrier mobility controlled by both electric field and temperature is evaluated by simulations and experiments. The molecular chain displacement model incorporating the thermoelectric effect of carrier mobility is examined to elucidate the experimental results. Trapping and de-trapping characteristics of space charge and mobility dynamics are modeled using hopping and Poole-Frenkel mechanisms. The experimental outcomes reveal that the DC electrical breakdown reduces with corresponding increment in temperature and thickness. Trapping parameters are estimated from experiments for simulations. The DC breakdown strength from experiments represents an inverse power relation with both the insulation thickness and temperature. The simulation results of molecular chain model with hopping mobility express more permanence with experimental results in comparison with Poole-Frenkel mobility.