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Correlation functions from multiple solution of the transient Boltzmann equation in semiconductors: Application to noise temperature of holes in silicon
Journal article   Peer reviewed

Correlation functions from multiple solution of the transient Boltzmann equation in semiconductors: Application to noise temperature of holes in silicon

L. Hlou, K. Amechnoue, J. Diyadi, J.-C. Vaissière, L. Varani and A. Moatadid
Journal of Applied Physics, Vol.88(2), pp.838-841
15/07/2000
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