Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

Journal article

Open access

Peer reviewed

Journal of Electronic Testing: : Theory and Applications, Vol.20(4), pp.375-387

2004

Abstract

Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

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Title: Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure
Creators - without role: Florence Azaïs - Conception et Test de Systèmes MICroélectroniques
Serge Bernard - Université de Montpellier
Yves Bertrand - Université de Montpellier
Mariane Comte - Centre National de la Recherche Scientifique
Michel Renovell - Université de Montpellier
Publication Details: Journal of Electronic Testing: : Theory and Applications, Vol.20(4), pp.375-387
Identifiers: 9946764209311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Journal article
Local Fields: lirmm-00108545