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Continuous-wave scanning terahertz near-field microscope
Journal article   Open access   Peer reviewed

Continuous-wave scanning terahertz near-field microscope

Jean-Paul Guillet, Laurent Chusseau, R. Adam, T. Grosjean, A. Pénarier, F.I. Baida and D. Charraut
Microwave and Optical Technology Letters, Vol.53(3), pp.580-582
2011

Abstract

near-field scanning microscopy Terahertz and submillimeter equipment near-filed imaging probe Sommerfeld waves
A versatile cw measurement setup for terahertz near-field reflectometry is proposed. Propagation, coupling, and focusing of wire guided modes are used to achieve a λ/33 resolution while imaging a metal corner deposited on glass. The setup is source and detector independent owing to wave coupling and decoupling with differential phase plates.
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