Résumé
Single event transients generated in a large-area photodiode were compared using a variety of different pulsed laser systems. Differences in transient amplitudes and charge collection are attributed to the different laser characteristics.
- Titre
- Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL
- Créateurs - sans rôle
- S. Buchner - United States Naval Research LaboratoryNicolas Jean-Henri Roche - Université de Montpellier, Institut d'Electronique et des Systèmes - IESJ. Warner - United States Naval Research LaboratoryD. Mcmorrow - United States Naval Research LaboratoryF. Miller - Defence & SecurityS. Morand - Defence & SecurityV. Pouget - Laboratoire de l'Intégration du Matériau au SystèmeC. Larue - Institut Polytechnique de BordeauxV. Ferlet-Cavrois - European Space Research and Technology CentreF. El Mamouni - Vanderbilt UniversityHeikki Kettunen - University of JyväskyläP. C. Adell - Jet Propulsion LaboratoryG. Allen - Jet Propulsion LaboratoryDavid Aveline - Jet Propulsion Laboratory
- Détails de publication
- IEEE Transactions on Nuclear Science, Vol.59(4), pp.988-998
- Identifiants
- 99150632609311
- Unité académique
- Institut d'Electronique et des Systèmes - IES
- Langue
- English
- Type de ressource
- Journal article
- Champs locaux
- hal-01633618