Comparison Between Point Defect Generation by <formula formulatype="inline"><tex Notation="TeX">$\gamma$</tex></formula>-rays in Bulk and Fibre Samples of High Purity Amorphous <formula formulatype="inline"> <tex Notation="TeX">${\hbox {SiO}}_{2}$</tex></formula>

Benoit Brichard; Simonpietro Agnello; Laura Nuccio; Laurent Dusseau

doi:10.1109/TNS.2008.2001706

$Comparison Between Point Defect Generation by <formula formulatype="inline"><tex Notation="TeX">$\gamma$</tex></formula>-rays in Bulk and Fibre Samples of High Purity Amorphous <formula formulatype="inline"> <tex Notation="TeX">${\hbox {SiO}}_{2}$</tex></formula>$

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Comparison Between Point Defect Generation by $\gamma$-rays in Bulk and Fibre Samples of High Purity Amorphous ${\hbox {SiO}}_{2}$

Benoit Brichard, Simonpietro Agnello, Laura Nuccio et Laurent Dusseau

IEEE Transactions on Nuclear Science, Vol.55(4), pp.2121 - 2125

08/2008

DOI: https://doi.org/10.1109/TNS.2008.2001706

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Titre: Comparison Between Point Defect Generation by $\gamma$-rays in Bulk and Fibre Samples of High Purity Amorphous ${\hbox {SiO}}_{2}$
Créateurs - sans rôle: Benoit Brichard - Belgian Nuclear Research Centre
Simonpietro Agnello - University of Palermo
Laura Nuccio - University of Palermo
Laurent Dusseau - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Détails de publication: IEEE Transactions on Nuclear Science, Vol.55(4), pp.2121 - 2125
Identifiants: 99152745609311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Journal article
Champs locaux: hal-01630132