Cold-field-emission tips aging study using surface potential measurements

Journal article

Peer reviewed

H. Dongmo, C. Guasch and J. Bonnet

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, Vol.vol. 22(6), pp.2860-2862

2004

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Title: Cold-field-emission tips aging study using surface potential measurements
Creators - without role: H. Dongmo - Université de Montpellier
C. Guasch - Université de Montpellier
J. Bonnet - Université de Montpellier
Publication Details: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, Vol.vol. 22(6), pp.2860-2862
Identifiers: 9943899509311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-00327354