Abstract
In the recent context of emerging two‐dimensional (2D) materials, a comprehensive set of spatially resolved photoelectron spectroscopic techniques providing information ranging from surface chemical states to electronic band structure must be available at the practical level (i.e. from laboratory‐based instrumentation) for a better understanding of their outstanding properties. We highlight recent capabilities of X‐ray PhotoElectron Emission Microscopy (XPEEM) and reciprocal‐space VUV‐PEEM (kPEEM) for addressing this issue, with a report on microscopic analyses of chemical vapor deposited (CVD) molybdenum disulfide (MoS2) domains. These include band structure imaging with event‐counting detection allowing to perform angle‐resolved ultra‐violet photoelectron spectroscopy (ARUPS) in a parallel way with energy resolution of 200 meV and less, and k resolution of 0.05 Å−1.