Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation

T. Mérelle; S. Serre; Frédéric Saigné; B. Sagnes; G. Gasiot; P. Roche; T. Carrière; M.-C. Palau

doi:10.1109/TNS.2006.878819

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Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation

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Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation

T. Mérelle, S. Serre, Frédéric Saigné, B. Sagnes, G. Gasiot, P. Roche, T. Carrière and M.-C. Palau

IEEE Transactions on Nuclear Science, Vol.53(4), pp.1897-1901

2006

DOI: https://doi.org/10.1109/TNS.2006.878819

Abstract

Bulk

charge sharing

diffusion

neutron

SEU

SRAM

TCAD simulations

The charge sharing quantification in the case of neutron induced SEUs in a 130 nm bulk SRAM is presented. Conclusions on its contribution to the soft errors sensitivity evaluation using Monte-Carlo codes are underlined

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Title: Charge Sharing Study in the Case of Neutron Induced SEU on 130 nm Bulk SRAM Modeled by 3-D Device Simulation
Creators - without role: T. Mérelle - Université de Montpellier
S. Serre - Université de Montpellier
Frédéric Saigné - Université de Montpellier
B. Sagnes - Université de Montpellier
G. Gasiot - STMicroelectronics
P. Roche - STMicroelectronics
T. Carrière - EADS, Corporate Research Center
M.-C. Palau
Publication Details: IEEE Transactions on Nuclear Science, Vol.53(4), pp.1897-1901
Identifiers: 9947362709311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-00328264