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Characterization of peptide attachment on silicon nanowires by X-ray photoelectron spectroscopy and mass spectrometry
Journal article   Peer reviewed

Characterization of peptide attachment on silicon nanowires by X-ray photoelectron spectroscopy and mass spectrometry

Ievgen Kurylo, Mathieu Dupré, Sonia Cantel, Christine Enjalbal, Hervé Drobecq, Sabine Szunerits, Oleg Melnyk, Rabah Boukherroub and Yannick Coffinier
Analyst, Vol.142(6), pp.969-978
2017
PMID: 28239690

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