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Characterization of ZnSe epitaxial layers by four-wave mixing experiments
Journal article   Peer reviewed

Characterization of ZnSe epitaxial layers by four-wave mixing experiments

A. Chergui, J Valenta, J Moniatte, P. Gilliot, J Grun, Thierry Cloitre and R. Aulombard
Semiconductor Science and Technology, Vol.11(6), pp.952 - 958
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
01/06/1996

Abstract

QUANTUM-WELL STRUCTURES ROOM-TEMPERATURE OPTICAL NONLINEARITIES SEMICONDUCTORS LASER SPECTROSCOPY PURITY
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