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Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator
Journal article   Open access   Peer reviewed

Characterization of Single-Event Effects in a Microcontroller with an Artificial Neural Network Accelerator

Carolina Imianosky, André Martins Pio de Mattos, Douglas Almeida dos Santos, Douglas Rossi de Melo, Maria Kastriotou, Carlo Cazzaniga and Luigi Dilillo
Electronics, Vol.13(22)
14/11/2024

Abstract

Artificial Neural Network Edge AI Artificial Intelligence Accelerator Radiation Effects Reliability Single-Event Upset Single-Event Effects Atmospheric Environments Neutrons
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