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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing
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Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing

Mario Sacristan Barbero, Ivan Slipukhin, Matteo Cecchetto, Daniel Prelipcean, Ygor Aguiar, Kacper Bilko, Natalia Emriskova, Andreas Waets, Andrea Coronetti, Maria Kastriotou, …
IEEE transactions on nuclear science, Vol.71(8), pp.1557-1564
01/08/2024

Résumé

Beam fragmentation Detectors FLUktuierende KAskade (FLUKA) heavy-ion beam Ion beams Ions Kinetic energy Monte Carlo simulations Particle beams RADiation facility Network for the EXploration of effects for indusTry and research (RADNEXT) Silicon single-event effects (SEEs) solid-state silicon detectors static random access memory (SRAM) memories super proton synchrotron (SPS) north area (NA) Testing ultrahigh-energy (UHE) beam

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