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Carrier lifetime influence on clamped silicon wafer resonance by PTA effect
Journal article   Open access   Peer reviewed

Carrier lifetime influence on clamped silicon wafer resonance by PTA effect

C. Chapus, F. Augereau, J. Podlecki, Gaëtan Lévêque, A. Foucaran and J. Attal
European Physical Journal: Applied Physics, Vol.50(3)
16/04/2010

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Physical Sciences
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