Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Journal article

Open access

Peer reviewed

Da. Martin, Romain Desplats, Gérard Haller, Florence Azaïs and Pascal Nouet

Microelectronics Reliability, Vol.44(9/11), pp.1553-1558

2004

Abstract

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

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Title: Automated Diagnosis and Probing Flow for Fast Fault Localization in IC
Creators - without role: Da. Martin
Romain Desplats
Gérard Haller
Florence Azaïs - Conception et Test de Systèmes MICroélectroniques
Pascal Nouet - Conception et Test de Systèmes MICroélectroniques
Publication Details: Microelectronics Reliability, Vol.44(9/11), pp.1553-1558
Identifiers: 9946766309311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Journal article
Local Fields: lirmm-00108546