Analysis of Resistive-Open Defects in SRAM Sense Amplifiers

Journal article

Peer reviewed

Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel and Magali Bastian Hage-Hassan

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.17(10), pp.1556-1559

2009

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Title: Analysis of Resistive-Open Defects in SRAM Sense Amplifiers
Creators - without role: Alexandre Ney - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Patrick Girard - Université de Montpellier
Serge Pravossoudovitch - Université de Montpellier
Arnaud Virazel - Université de Montpellier
Magali Bastian Hage-Hassan - Infineon Technologies France
Publication Details: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.17(10), pp.1556-1559
Identifiers: 9944393609311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Journal article
Local Fields: lirmm-00371367