Abstract
Memory testing is crucial as memories play an everincreasing important role in modern computing systems, to which a memory malfunction can lead to a system failure. Memory testing is commonly addressed by a functional testing approach that consist in verifying the manufactured memory function. Functional testing focuses on identifying memory functional failure mechanisms, which are modeled by Functional Fault Models (FFM), and for which dedicated test algorithms are developed to ensure their detection. However, as technology shrinks, fault mechanisms in memories become more complex, as well as their detection conditions. To anticipate any limitation, memory structural testing is investigated. Structural testing proposes to study the defect before the fault, as one or several manufactured defects or imperfections may be responsible for a fault. A structural test methodology for memory has been recently published and proposes to adapt the Cell-Aware test methodology from the digital domain to analog memories. As the resulting Structural Fault Models (SFM) for analog memory is compatible with digital test environment, this work proposes a digital SRAM modeling methodology, compatible with digital simulation and test environments, leveraging Fault Simulator for test algorithm coverage analysis, and Automatic Test Pattern Generator for dedicated and optimized defect-specific test generation.