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An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline
Journal article   Open access   Peer reviewed

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Aljoša Hafner, Luca Costa, George Kourousias, Valentina Bonanni, Milan Žižić, Andrea Stolfa, Benjamin Bazi, Laszlo Vincze and Alessandra Gianoncelli
Analyst, Vol.149(3), pp.700-706
2024

Abstract

AFM SXTM XRF
The development of an in situ combination of AFM and soft X-ray μXRF in a single instrument, with AFM integration accomplished without substantial original set-up alteration.
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https://doi.org/10.1039/D3AN01358HView
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