- An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials
- Hakim Sadou - University of JijelTarik Hacib - University of JijelHulusi Acikgoz - KTO Karatay UniversityYann Le Bihan - Laboratoire Génie électrique et électronique de ParisOlivier Meyer - Université Paris-SudMohamed Rachid Mekideche - University of Jijel
- COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, Vol.37(2), pp.799-813
- 99247192509311
- Université de Montpellier
- English
- Journal article
- hal-03146287
An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials
COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, Vol.37(2), pp.799-813
05/03/2018
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