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A new tool for measuring island dimensions and spatial correlations in quantum dot multilayers: Raman scattering interferences
Article de revue   Avec comité de lecture

A new tool for measuring island dimensions and spatial correlations in quantum dot multilayers: Raman scattering interferences

M Cazayous, J Groenen, J.R Huntzinger, A Mlayah, U Denker et O.G Schmidt
Materials science & engineering. B, Solid-state materials for advanced technology, Vol.88(2), pp.173-176
16/01/2002

Résumé

Quantum dots Raman interferences Spatial correlations

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